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Suppression of stress-induced leakage current after Fowler-Nordheim stressing by deuterium pyrogenic oxidation and deuterated poly-Si deposition

✍ Scribed by Mitani, Y.; Satake, H.; Itoh, H.; Toriumi, A.


Book ID
114616769
Publisher
IEEE
Year
2002
Tongue
English
Weight
247 KB
Volume
49
Category
Article
ISSN
0018-9383

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