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Suppression of leakage currents in GaN-based LEDs induced by reactive-ion etching damages

✍ Scribed by Mosca, M.; Castiglia, A.; Bühlmann, H.-J.; Dorsaz, J.; Feltin, E.; Carlin, J.-F.; Grandjean, N.


Book ID
119992558
Publisher
EDP Sciences
Year
2008
Tongue
English
Weight
350 KB
Volume
43
Category
Article
ISSN
1286-0042

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