✦ LIBER ✦
Supply voltage design tradeoffs between speed and NMOSFET reliability of half-micrometer BiCMOS gates
✍ Scribed by Momose, H.; Unno, Y.; Maeda, T.
- Book ID
- 114537609
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 758 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.75167
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