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Superconductivity and normal state conduction mechanism in oxidized thin aluminum films

✍ Scribed by Myron Strongin; J.M. Dickey; J.E. Crow

Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
388 KB
Volume
8
Category
Article
ISSN
0038-1098

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Post-breakdown conduction mechanism of t
Post-breakdown conduction mechanism of thin oxide films and their aspects
✍ Kenji Komiya; Takashi Oka; Naoki Okada; Yasuhisa Omura πŸ“‚ Article πŸ“… 2003 πŸ› John Wiley and Sons 🌐 English βš– 968 KB

## Abstract This study investigates extremely thin silicon oxide with thicknesses of 3 to 5 nm produced by various fabrication processes, and the post‐breakdown characteristics are studied. This paper describes the results of comparison. By analysis of the conduction characteristics after intrinsic