Summary of a Group Discussion on the Future of Electron Microscopy at the Fifth Conference on Frontiers of Electron Microscopy in Materials Science (Oakland, CA, 21–24 June 1994)

✍ Scribed by J. Silcon; C. Allen; S. Bradley

• Book ID: 119836432
• Publisher: John Wiley and Sons
• Year: 1995
• Tongue: English
• Weight: 249 KB
• Volume: 180
• Category: Article
• ISSN: 0022-2720
• DOI: 10.1111/j.1365-2818.1995.tb03660.x