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Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies

✍ Scribed by G Chiarotti; P Chiaradia; F Arciprete; C Goletti


Book ID
108416413
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
113 KB
Volume
175-176
Category
Article
ISSN
0169-4332

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The method of reflectance anisotropy spectroscopy (RAS) has proved extremely useful in monitoring the structure of semiconductor surfaces during growth under metal-organic vapour phase epitaxy conditions. Similarly, scanning tunnelling microscopy (STM) has proved invaluable in providing information