Successive pattern classification based on test feature classifier and its application to defect image classification

✍ Scribed by Yukinobu Sakata; Shuni’chi Kaneko; Yuji Takagi; Hirohito Okuda

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 399 KB
• Volume: 38
• Category: Article
• ISSN: 0031-3203
• DOI: 10.1016/j.patcog.2005.04.013