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Substrate removal and box thinning effects on total dose response of FDSOI NMOSFET

✍ Scribed by Gouker, P.; Burns, J.; Wyatt, P.; Warner, K.; Austin, E.; Milanowski, R.

Book ID: 120608869
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 859 KB
Volume: 50
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2003.821822

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