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Substrate orientation dependence of self-limited atomic-layer etching of Si with chlorine adsorption and low-energy Ar+ irradiation

✍ Scribed by Koji Suzue; Takashi Matsuura; Junichi Murota; Yasuji Sawada; Tadahiro Ohmi


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
443 KB
Volume
82-83
Category
Article
ISSN
0169-4332

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