Substrate hot electron injection modelling based on lucky drift theory

✍ Scribed by X.-J. Yuan; J.S. Marsland; W. Eccleston

• Book ID: 103599050
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 307 KB
• Volume: 22
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(93)90169-6