Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)
✍ Scribed by Winesett, D?A; Ade, H; Sokolov, J; Rafailovich, M; Zhu, S
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 599 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0959-8103
No coin nor oath required. For personal study only.
✦ Synopsis
We studied the effects of different substrates on the development of the morphologies in thin ®lm polymer blends in as-spun and annealed ®lms. We have utilized thin ®lms of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption ®ne structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition.
📜 SIMILAR VOLUMES
## Abstract **Summary:** The phase‐morphology inversion in two blend systems of polystyrene/poly(methyl methacrylate) (PS/PMMA) and polystyrene/poly(__ε__‐caprolactone) (PS/PCL) has been studied after their thin films were prepared on glass substrates by spin‐coating from a co‐solvent tetrahydrofur
## Abstract Results of the morphological studies of silver particulate films deposited at a rate of 0.4 nm/s on polymeric blends of polystyrene (PS) and poly (4‐vinylpyridine) (P4VP) held at a temperature 457 K by evaporation in a vacuum of 8 × 10^−6^ Torr are reported here. The morphology of silve
Morphology and electrical properties of short carbon fiber-filled high-density polyethylene (HDPE)/poly(methyl methacrylate)(PMMA) polymer blends have been studied. The percolation threshold of HDPE50/PMMA50 blends filled with vaporgrown carbon fiber (VGCF), 1.25 phr VGCF content, is much lower than