Substrate-bias effect and source-drain breakdown characteristics in body-tied short-channel SOI MOSFET's

✍ Scribed by Maeda, S.; Hirano, Y.; Yamaguchi, Y.; Iwamatsu, T.; Ipposhi, T.; Ueda, K.; Mashiko, K.; Maegawa, S.; Abe, H.; Nishimura, T.

• Book ID: 114537530
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 295 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.737454