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Submicroscopic Defects in Metals and their Influence on HVEM In-situ Experiments

โœ Scribed by Dr. M. Kiritani; Dr. K. Urban


Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
400 KB
Volume
14
Category
Article
ISSN
0232-1300

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Advances in transmission electron micros
โœ Jeff Th.M. De Hosson ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 520 KB

## Abstract In the field of transmission electron microscopy (TEM), fundamental and practical reasons still remain that hamper a straightforward correlation between microscopic structural information and deformation mechanisms in materials. In this article, it is argued that one should focus in par