✦ LIBER ✦
Submicron optical sectioning microscopy: A particular inverse problem solution adapted to epilayer defect analysis
✍ Scribed by J.P. Fillard; P.C. Montgomery; P. Gall; J. Bonnafé; M. Castagné
- Book ID
- 103164290
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 402 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0022-0248
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