𝔖 Bobbio Scriptorium
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Submicron deformation field measurements: Part 1. Developing a digital scanning tunneling microscope

✍ Scribed by G. Vendroux; W. G. Knauss


Publisher
Sage Publications
Year
1998
Tongue
English
Weight
904 KB
Volume
38
Category
Article
ISSN
0014-4851

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