✦ LIBER ✦
Subgap Leakage in $\hbox{Nb/Al}$– $\hbox{AlO}_{\rm x}\hbox{/Nb}$ Josephson Junctions and Run-to-Run Reproducibility: Effects of Oxidation Chamber and Film Stress
✍ Scribed by Tolpygo, S. K.; Amparo, D. J. C.; Hunt, R. T.; Vivalda, J. A.; Yohannes, D. T.
- Book ID
- 118174733
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 485 KB
- Volume
- 23
- Category
- Article
- ISSN
- 1051-8223
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