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Sub-quarter micron phase shifting lithography using the desire process at 248 nm (deep UV)

✍ Scribed by K. Ronse; R. Jonckheere; A.M. Goethals; K.H. Baik; L. Van den hove


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
439 KB
Volume
17
Category
Article
ISSN
0167-9317

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