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Sub-micron resolution rf cavity beam position monitor system at the SACLA XFEL facility

✍ Scribed by Maesaka, H.; Ego, H.; Inoue, S.; Matsubara, S.; Ohshima, T.; Shintake, T.; Otake, Y.


Book ID
119333256
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
825 KB
Volume
696
Category
Article
ISSN
0168-9002

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