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Sub-electron noise measurements on repetitive non-destructive readout devices

✍ Scribed by Stefan Wölfel; Sven Herrmann; Peter Lechner; Gerhard Lutz; Matteo Porro; Rainer Richter; Lothar Strüder; Johannes Treis


Book ID
108219781
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
286 KB
Volume
566
Category
Article
ISSN
0168-9002

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