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Sub-10 nm monogranular metallic lines formed by 200 kV electron-beam lithography and lift-off in polymethylmethacrylate resist

✍ Scribed by C. Vieu; M. Mejias; F. Carcenac; G. Faini; H. Launois


Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
332 KB
Volume
35
Category
Article
ISSN
0167-9317

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