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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, Auger electron spectroscopy, and atom-probe field-ion microscopy

✍ Scribed by M. Futamoto; I. Yuito; U. Kawabe; O. Nishikawa; Y. Tsunashima; Y. Hara

No coin nor oath required. For personal study only.

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