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Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements

✍ Scribed by Imai, Y.; Li, H.H.; Takumi, H.; Tanida, H.; Watanabe, I.; Takiue, T.; Matsubara, H.; Aratono, M.


Book ID
119289650
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
452 KB
Volume
388
Category
Article
ISSN
0021-9797

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