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Study on the dielectric loss tan σ of metal-insulator-metal and metal-insulator-metal-insulator-metal junctions with polyimide Langmuir-Blodgett films

✍ Scribed by Masahito Kushida; Mitsumasa Iwamoto; Nobuo Ueno; Kazuyuki Sugita; Taro Hino


Book ID
107864588
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
397 KB
Volume
244
Category
Article
ISSN
0040-6090

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