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Study on the correlation between the photovoltaic effect and the defect density at the surface of a poly-Si solar cell by using photoconductive atomic force microscopy (PC-AFM)

✍ Scribed by Jinhee Heo, Youngmok Rhyim


Book ID
115076837
Publisher
The Korean Physical Society
Year
2012
Tongue
English
Weight
301 KB
Volume
60
Category
Article
ISSN
0374-4884

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