𝔖 Bobbio Scriptorium

✦ LIBER ✦

Study of the validity of electronic parts stress models : J. M. Grange. IEEE Trans. Reliab.R-20, No. 3 (1971), p. 136

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 112 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90606-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Bayesian confidence limits for the relia

Bayesian confidence limits for the reliability of mixed exponential and distribution-free cascade subsystems : M. D. Springer and J. K. Byers. IEEE Trans. Reliab.R-20, No. 1 (1971), p. 24

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 71 KB