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Study of the temperature and field dependence of electron drift mobility in α-Si1−χCχ:H using the time-of-flight technique

✍ Scribed by P.A. Bayley; A.K. Browne; J.M. Marshall; R.A.C.M.M. Van Swaaij; A.R. Hepburn


Book ID
115989056
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
246 KB
Volume
164-166
Category
Article
ISSN
0022-3093

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