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Study of the structure of silica film by infrared spectroscopy and electron diffraction analyses

✍ Scribed by Tomonari Morioka; Seiji Kimura; Noritoshi Tsuda; Chihiro Kaito; Yoshio Saito; Chiyoe Koike


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
533 KB
Volume
299
Category
Article
ISSN
0035-8711

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