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Study of the size effects in the electrical resistivity of ultrathin (<Cu 40&#xa0;nm) films in the framework of the statistical conduction models

โœ Scribed by Saci Messaadi; Hadria Medouer; Mosbah Daamouche


Book ID
116605663
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
368 KB
Volume
489
Category
Article
ISSN
0925-8388

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