Amplitude modulated step scan Fourier tr
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Remes, Z. ;Nesladek, M. ;Bergonzo, P. ;Barjon, J. ;Jomard, F.
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Article
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2007
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John Wiley and Sons
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English
⚖ 459 KB
## Abstract We report on the development of amplitude modulated step‐scan Fourier‐transform photocurrent spectroscopy (AMFTPS) as a sensitive tool for detecting shallow and deep electronic states in high resistive semiconductors. We present fundamental aspects of dual beam photoconductivity (DBP) a