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Study of the effects of rapid thermal annealing in generation–recombination noise in MBE grown GaN thin films

✍ Scribed by C. Surya; C.F. Zhu; B.H. Leung; W.K. Fong; C.C. Cheng; J.K.O. Sin

Book ID: 108361756
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 101 KB
Volume: 40
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(00)00066-4

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