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Study of the effects of a stepped doping profile in short-channel MOSFETs

โœ Scribed by Lopez-Villanueva, J.A.; Gamiz, F.; Roldan, J.B.; Ghailan, Y.; Carceller, J.E.; Cartujo, P.


Book ID
114536940
Publisher
IEEE
Year
1997
Tongue
English
Weight
170 KB
Volume
44
Category
Article
ISSN
0018-9383

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