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Study of the effect of reflow time and temperature on Cu–Sn intermetallic compound layer reliability

✍ Scribed by Wei Huang; James M Loman; Bülent Sener


Book ID
108361920
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
196 KB
Volume
42
Category
Article
ISSN
0026-2714

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