𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Study of Surface Reactions by Diffraction of Low-energy Electrons

✍ Scribed by Priv.-Doz. Dr. G. Ertl

Publisher
John Wiley and Sons
Year
1968
Tongue
English
Weight
244 KB
Volume
7
Category
Article
ISSN
0044-8249

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Surface excitation parameters of low-ene
Surface excitation parameters of low-energy electrons crossing solid surfaces
✍ Kwei, C. M.; Wang, C. Y.; Tung, C. J. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 424 KB πŸ‘ 1 views

The surface excitation parameter, which describes the inΓ‘uence of surface excitations by electrons for the vacuum side in electron spectroscopies, has been calculated for electrons of 200-2000 eV energies crossing surfaces of Cu, Ag, Au, Fe, Pd, Ni, MgO and These calculations were performed for both

Reflected Electron Energy-loss Microscop
Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 1 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou