✦ LIBER ✦
Study of stress-induced leakage current (SILC) in HfO2/Dy2O3 high-κ gate stacks on germanium
✍ Scribed by M.S. Rahman; E.K. Evangelou; I.I. Androulidakis; A. Dimoulas
- Book ID
- 108210790
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 450 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0026-2714
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