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Study of Stress in TiO2 Films Grown by Electron-Beam Evaporation

✍ Scribed by Chen, Tao; Wang, Duo Shu; Xiong, Yu Qing

Book ID: 121717737
Publisher: Trans Tech Publications, Ltd.
Year: 2011
Tongue: English
Weight: 445 KB
Volume: 189-193
Category: Article
ISSN: 1662-8958
DOI: 10.4028/www.scientific.net/amr.189-193.1233

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