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Study of some optical properties of evaporated TbCu0.6Al0.4 thin films

✍ Scribed by W.H. Osman

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
357 KB
Volume
28
Category
Article
ISSN
0030-3992

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✦ Synopsis

Al 0.6 0,4 thin films with different thicknesses, ranging from 26 to 100 nm, were prepared on a glass substrate. The complex refractive index of thin films has been determined for the first time from the measurements of reflectance, R, and transmittance, T, at atmost normal incidence in the spectral range of 400-2200 nm. Some micro-characteristics of TbCuo,sAlo,4 alloy including free charge concentration, n,, the relaxation time, 7, the static conductivity, G, and the electron velocity at the Fermi surface, V F, have been evaluated using the simplified Drude model.

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