Study of Sn migration during relaxation of Ge1-xSnx layers using atom probe tomography

✍ Scribed by Arul Kumar; Federica Gencarelli; Ajay Kumar Kambham; Matthieu Gilbert; Benjamin Vincent; Wilfried Vandervorst

• Book ID: 115561640
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 857 KB
• Volume: 9
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.201200222