✦ LIBER ✦
Study of secondary electron emission from various targets due to 100 MeV Si7+ beam
✍ Scribed by RS Chauhan; VK Mittal; TK Nandi; A Mandal; DK Avasthi
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 303 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.
✦ Synopsis
The total secondary electron yields Y were measured for 100 MeV Si7+ ions on Be, Al, Si, Ni, Ag and Au as a function of the incident angle of projectile ranging from 0" to 654 In order to compare the angular dependence of the electron yield for Si7+ ions using different targets, the experimental curves were fitted by the empirical relation of the form Y(
where 8 is the angle of incidence, Y(O) is the yield at normal Incidence (0 = 0") andf is a fitting parameter.
The value off varied from 0.69 to 1.52. The Z dependence of Y(O) for various targets (z = 4 to 79) were also observed.