Study of schottky barrier heights of indium-tin-oxide on p-GaN using x-ray photoelectron spectroscopy and current-voltage measurements

✍ Scribed by Yow-Jon Lin; Chou-Wei Hsu

• Book ID: 107453113
• Publisher: Springer US
• Year: 2004
• Tongue: English
• Weight: 272 KB
• Volume: 33
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-004-0032-y