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Study of residual strains in horizontal-Bridgman-grown gallium arsenide wafers by a high-sensitivity computer-controlled infrared polariscope

✍ Scribed by Yamada, Masayoshi


Book ID
120075915
Publisher
American Institute of Physics
Year
1993
Tongue
English
Weight
941 KB
Volume
74
Category
Article
ISSN
0021-8979

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