✦ LIBER ✦
Study of radiation-induced leakage current between adjacent devices in a CMOS integrated circuit
✍ Scribed by Ding, Lili; Guo, Hongxia; Chen, Wei; Fan, Ruyu
- Book ID
- 120270331
- Publisher
- IOP Publishing
- Year
- 2012
- Tongue
- English
- Weight
- 345 KB
- Volume
- 33
- Category
- Article
- ISSN
- 1674-4926
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