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Study of PMMA recoveries on micrometric patterns replicated by nano-imprint lithography

✍ Scribed by Christel Martin; Laurence Ressier; Jean Pierre Peyrade


Book ID
104428447
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
146 KB
Volume
17
Category
Article
ISSN
1386-9477

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✦ Synopsis


We present a study of poly methyl methacrylate (PMMA) mechanical recoveries observed in the center of micro-scale structures replicated by nanoimprint lithography. Atomic force microscopy statistical analysis clearly reveals that the height and width of recoveries increase with the imprint force until a critical force above which they diminish to zero. This phenomenon, due to problems of PMMA resist transport, can be explained as a relaxation, directly after the demolding stage, of the elastic stresses stored by the resist during the imprint stage.