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Study of phase transition and electrical resistivity of tantalum nitride films prepared by DC magnetron sputtering with OES detection system

✍ Scribed by Y.M Lu; R.J Weng; W.S Hwang; Y.S Yang


Book ID
117226611
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
834 KB
Volume
398-399
Category
Article
ISSN
0040-6090

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