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Study of oxygen self-diffusion in oxides by ion beam techniques: comparison between nuclear reaction analysis and SIMS

✍ Scribed by A.C.S. Sabioni; F.L. Freire Jr; C.V.Barros Leite; B.A. Amami; C. Dolin; C. Monty; F. Millot

Book ID
113284603
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
423 KB
Volume
73
Category
Article
ISSN
0168-583X

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📜 SIMILAR VOLUMES

Analysis of superconducting thin films b
Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS
✍ J. P. Stoquert; E. Fogarassy; R. Stuck; G. Guillaume; P. Siffert; J. Perrière 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 508 KB

## Abstract Thin layers of YBaCuO and BiSrCaCuO superconducting oxides have been deposited on different substrates by the laser evaporation technique using a pulsed ArF excimer laser. The films were analysed by different ion beam techniques: nuclear reaction (NR), particle‐induced x‐ray emission (P