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Study of oxygen depth distribution in Si1Ox and Mo1Ox films using 4He ion elastic scattering

✍ Scribed by V. Hnatowicz; H. Macholdt; F.-W. Richter


Book ID
113282133
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
455 KB
Volume
62
Category
Article
ISSN
0168-583X

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