## Abstract In this paper, a numerical study is carried out in order to establish systematic convergence criteria for the method of lines. These criteria allow an optimum determination of microstrip step discontinuities' three sets of lengths, that are needed to determine the __S__โparameters of th
โฆ LIBER โฆ
Study of microstrip step discontinuities on bianisotropic substrates using the method of lines and transverse resonance technique
โ Scribed by Yinchao Chen; Beker, B.
- Book ID
- 114551960
- Publisher
- IEEE
- Year
- 1994
- Tongue
- English
- Weight
- 536 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0018-9480
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We would like to thank Dr. M. Essaaidi for pointing out an error in Eq. (1) of the above-referenced paper. We regret any misunderstanding caused by this error.
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## Abstract A finite elementsโbased Method of Lines is used to calculate static capacitances for microstrip line structures with layered substrates of arbitrary permittivity tensor. The problem is solved by discretizing the associated static equations in one coordinate variable using finite element