✦ LIBER ✦
Study of latch-up immunization in bulk CMOS integrated circuits exposed to transient ionizing radiation
✍ Scribed by RuiBin Li, Wei Chen, DongSheng Lin, ShanChao Yang, XiaoYan Bai, GuiZhen Wang, Yan Liu, Chao Qi, Qiang Ma
- Book ID
- 118814311
- Publisher
- SP Science China Press
- Year
- 2012
- Tongue
- English
- Weight
- 706 KB
- Volume
- 55
- Category
- Article
- ISSN
- 1006-9321
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