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Study of laser-deposited Bi2Sr2CaCu2O8 + δ thin films by rutherford backscattering, X-ray photoemission and X-ray Auger spectroscopies

✍ Scribed by F. Roche; A. Balzarotti; M. De Crescenzi; N. Motta; Murali Sastry; F. Patella; J. Perrière; F. Kerhervé; G. Hauchecorne


Book ID
116017344
Publisher
Elsevier Science
Year
1989
Weight
587 KB
Volume
151
Category
Article
ISSN
0022-5088

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