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Study of irregular surfaces by secondary electron line scanning

✍ Scribed by Z.H. Huang; J.F. Tian; Z.G. Wang

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 320 KB
Volume: 129
Category: Article
ISSN: 0921-5093
DOI: 10.1016/0921-5093(90)90277-a

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