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Study of interaction between silicon surfaces in dilute ammonia peroxide mixtures (APM) and their components using atomic force microscope (AFM)

✍ Scribed by S. Siddiqui; J. Zhang; M. Keswani; A. Fuerst; S. Raghavan


Book ID
113797731
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
705 KB
Volume
88
Category
Article
ISSN
0167-9317

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